We’re Exhibiting at EDS 2025

The Engineering Design Show, 8 – 9 October 2025, Coventry Building Society Arena, UK, Stand J3

Supporting Manufacturer Information

0505 series

  • SRT Microcéramique

SRT Microcéramique SMD Low Inductance Class II Capacitors

SRT Microcéramique SMD Low Inductance Class II Capacitor
  • Low Inductance Class II Capacitor
  • Capacitance from 1.0 nF to 1.5 µF
  • Voltages from 6.3 V to 50 V
  • Operating temperatures of -55°C to +125°C
  • Inverted geometry reduces the ESL up to 60% to standard MLCC
  • Tested in accordance with CECC 32100 and AEC-Q200
  • Compliant
  • SRT Microcéramique

SRT Microcéramique RF Power High Frequency Capacitor Series

NP0 Capacitor Series | High Voltage | SRT Microcéramique
  • MLCC RF power, high frequency capacitors for RF instruments, lasers and similar applications
  • Highest quality and reliability, suitable for safety-critical industries
  • Dissipation factor under 5.10-4 at 1Vrms and 1MHz for values ≤ 1000pF and under 5.10-4 at 1Vrms and 1KHz for values > 1000pF
  • Insulation resistance of 25°C/Un 105 MΩ or 1000 Ohm-Farad whichever is less and 125°C/Un 104 MΩ or 100 Ohm-Farad whichever is less
  • Dielectric strength test performed per method 103 of EIA 198-2-E
  • Exempt

SRT Microcéramique SMD Low Inductance Class II Capacitors

  • Low Inductance Class II Capacitor
  • Capacitance from 1.0 nF to 1.5 µF
  • Voltages from 6.3 V to 50 V
  • Operating temperatures of -55°C to +125°C
  • Inverted geometry reduces the ESL up to 60% to standard MLCC
  • Tested in accordance with CECC 32100 and AEC-Q200

SRT Microcéramique RF Power High Frequency Capacitor Series

  • MLCC RF power, high frequency capacitors for RF instruments, lasers and similar applications
  • Highest quality and reliability, suitable for safety-critical industries
  • Dissipation factor under 5.10-4 at 1Vrms and 1MHz for values ≤ 1000pF and under 5.10-4 at 1Vrms and 1KHz for values > 1000pF
  • Insulation resistance of 25°C/Un 105 MΩ or 1000 Ohm-Farad whichever is less and 125°C/Un 104 MΩ or 100 Ohm-Farad whichever is less
  • Dielectric strength test performed per method 103 of EIA 198-2-E